Description :
Tenders for Supply Of Atomic Force Microscope (afm) , Nano Indenter , Micro Hardness Tester , X-ray Diffraction (xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy( Ftir) , Energy Dispersive Spectrometry (edx) & Electron Backscattered Diffraction (ebsd) , Co-ordinate Measuring Machine (cmm) , Form Tester , Stereo Microscopy , Sample Preparation , Surface Roughness Tester (contact Type)