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Scanning Electron Microscope Tenders

Get complete information related to latest Scanning Electron Microscope Tenders . from India at Classic Tenders. Search the best available tenders from Indian government tenders, domestic Scanning Electron Microscope Tenders , private tenders, online tenders, tender invitation notice, business tender notices, online tenders and bidding Scanning Electron Microscope Tenders .

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Bid Submission Date Range
Tender Value

State Government

CTN :43099238 Due date: 16 Jan, 202616 Jan, 2026 NA
Tender For corrigendum : supply of scanning electron microscope

Central Government/Public Sector

CTN :43476387 Due date: 29 Jan, 202629 Jan, 2026 NA
Tender For supply, installation and commissioning of advanced field emission scanning electron microscope fe-sem integrated with energy dispersive x ray spectroscopy edx for micro nano structural and elemental analysis qty 1 set

Central Government/Public Sector

CTN :43464475 Due date: 16 Jan, 202616 Jan, 2026 NA
Tender For supply of flanges -paddle bl and spacer250nbx150rating sa105ibr dimensions as per asme 16.48 table 1 , cs blnd flange 100nbx150rating rf sa105 ibr , blind flg 4inch cl300 rf sa105 ibr , wnrf flange sa105 50nb 2inch cl300ibr bore49.22mm , 4inch 300rating spectacle blind sa182 316l dimensions as per asme 16.48 table2 , 4inch 300rating wnrf flange ss316l bore102.26mm , 40nb 150rating wnrf flange sa182f316 bore38.14mm

State Government

CTN :43391601 Due date: 19 Jan, 202619 Jan, 2026 5.36 Lacs
Tender For supply of dental magnification loupe with led light inbuilt on a spectacle with internal and external correction and three magnification in a single loop

Central Government/Public Sector

CTN :43451343 Due date: 27 Jan, 202627 Jan, 2026 NA
Tender For supply of field emission scanning electron microscope with ebsd & eds

CTN :43433705 Due date: 17 Jan, 202617 Jan, 2026 5.36 Lacs
Tender For dental magnification loupe with led light inbuilt on a spectacle with internal and external correction and three magnification in a single loop

CTN :43421358 Due date: 13 Jan, 202613 Jan, 2026 NA
Tender For providing of customized amc/cmc for pre-owned products - scanning electron microscope; tescan vega 3 lmu; annual maintenance contract (amc); six-monthly; no

Central Government/Public Sector

CTN :43402042 Due date: 10 Jan, 202610 Jan, 2026 NA
Tender For providing of customized annual maintenance contract/cmc for pre-owned products - non comprehensive annual maintenance contract for field emission scanning electron microscope; carl zeiss; annual maintenance contract (amc); six-monthly; no

CTN :43378583 Due date: 14 Jan, 202614 Jan, 2026 NA
Tender For supply of ophthalmology department consumables d d -dist vision log mar chart set 2pcs , near vision log mar chart continuous test enlish , hiding heidi contrast chart gl usa , trial lens set full aperture imported , light box led for visual acuity test india a3 size india , universal trial frame all rotating usa , paediatric trial frame set with elastic fixed pd single piece , paediatric trial frame set of 8 pieces fixed pd , trial lens holder one pair , multiple pin hole occlude l shape , prismatic spectacle 5d st , prismatic spectacle 8d st , prismatic spectacle 10d st , prismatic spectacle 16d st , prismatic spectacle 20d st , prismatic spectacle 24d st , hand mag led 4x50mm 12d kh , hand mag led 7x50mm 24d , hand mag led 8x35mm 28d , hand mag led 10x35mm 36d , dome magnifier 4x50mm 12d , dome magnifier 4x65mm 12d , dome magnifier 4x80mm 12d , hand held monocular 3x , hand held monocular 4x , hand held monocular 6x , stand magnifier 2 5x50mm , stand magnifier 4x50mm , stand mag 7x8x10x12x35mm 4x450 , noir filter yellow grey red and amber , see tv 2 1x , pocket magnifier sliding 2 x 8d , pocket mag 3x 12d , pocket magnifier 4x led sliding 12d , pocket magnifier 6x 24d , stand magnifier cutaway 6x , bar reader mag, 2x120mm 8d , illu stand magnifier 7x50mm 24d , hand magnifier or neck 110mm 2 x 4d , reading stand 21 , signature guide set of 10

CTN :43321044 Due date: 14 Jan, 202614 Jan, 2026 NA
Tender For supply of field emmision scanning electron microscope with eds and e-beam lithography
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