Tender For supply of icp oes afm contact angle pl system etc : : - inductively coupled plasma optical emission spectroscopy , atomic force microscope , contact angle measurement system , photoluminescence spectrometer , thermoelectric performance measurement system , programmable spin coating system , tga and dsc , temperature dependent hall measurement setup , material and device simulation software
Tender For supply of computer controlled direct reading optical emission spectrometer alongwith comprehensive annual maintenance contract as detailed below.