Spectroscopy Tenders

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Central Government/Public Sector

CTN :42616311

08 Dec, 2025 NA

Kolkata - West Bengal

Tender For corrigendum : supply of scanning electron microscope with energy dispersive x-ray spectroscopy

Central Government/Public Sector

CTN :43020857

23 Dec, 2025 NA

Bhopal - Madhya Pradesh

Tender For supply installation and commissioning of dual view, polychromator based inductively coupled plasma- optical emission spectroscopy (icp-oes) with microwave digestion system

State Government

CTN :42774976

08 Dec, 2025 NA

Khorda - Odisha

Tender For corrigendum : supply of inductively coupled plasma-optical emission spectroscopy (icp-oes)

CTN :42973415

15 Jan, 2026 NA

Indore - Madhya Pradesh

Tender For supply, inspection, installation and commissioning, training and warranty of near atmospheric pressure x-ray photoelectron spectroscopy (nap-xps) analyzer system. (detailed technical specification as per annexure eclosed)

Central Government And Public Sector

CTN :42601229

11 Dec, 2025 NA

Mohindergarh - Haryana

Tender For corrigendum : supply, installation, testing and commissioning of time correlated single photon counting tcspc with low temperature photoluminescence pl spectroscopy under hefa grant at central university of haryana

CTN :42937229

23 Dec, 2025 NA

Indore - Madhya Pradesh

Tender For supply and installation of scanning electron microscopy with energy-dispersive x-ray spectroscopy (sem-eds)

Central Government/Public Sector

CTN :42940642

11 Dec, 2025 NA

Warangal-T - Telangana

Tender For supply, installation and commissioning of academic lab equipments with 1 year onsite warranty - sr4 spectrometer with high speed spectral acquisition with advanced singnal-to-noise performance, replaceable slit 10 m, high power tungsten halogen source, 360-2000 nm, -10,000 hrs, 2800 k, with 20w output, square one cuvette holder, universal quartz cuvette, 10mm path, 3.5ml 2 nos, quartz optical fiber 400um and 200um, vis/nir, premium 400 um reflection probe, uv/vis, 2 m wavelength range: 300nm - 1.1 m, diffuse reflectance standard, ptfe diffusing material: ptfe reflectivity: >98% (250-1500 nm)>95% (250-2200 nm), reflection probe holder is anodized aluminum platform for measurements at 45 and 90 to the surface, oceanview spectroscopy software with graphical user interface; 1 license with desirable control options